SEM images and EDS mapping of element C (in red) and Ni (in green) of thick NiOx:PEO films with different NiOx content. The cracks on the NiOx film are due to the slow drying process to obtain the desired high thickness required to perform the EDS analysis. The scale bar corresponds to 50 μm.

SEM images and EDS mapping of element C (in red) and Ni (in green) of thick NiOx:PEO films with different NiOx content. The cracks on the NiOx film are due to the slow drying process to obtain the desired high thickness required to perform the EDS analysis. The scale bar corresponds to 50 μm.